open-source software for scoring complex image-based assays (Broad Institute Inc)
90
Structured Review
Broad Institute Inc
open-source software for scoring complex image-based assays
Open Source Software For Scoring Complex Image Based Assays, supplied by Broad Institute Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/open-source+software+for+scoring+complex+image-based+assays/open+source+software+for+scoring+complex+image+based+assays/10__1017_slash_s1431927611012475-95-80-91
Average 90 stars, based on 1 article reviews
Open Source Software For Scoring Complex Image Based Assays, supplied by Broad Institute Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/open-source+software+for+scoring+complex+image-based+assays/open+source+software+for+scoring+complex+image+based+assays/10__1017_slash_s1431927611012475-95-80-91
Average 90 stars, based on 1 article reviews
open-source software for scoring complex image-based assays - by Bioz Stars,
2026-09
90/100 stars
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other:Article Title: MAM volume 17 issue Cover and Front matter Article Snippet: PROCEEDINGS MICROSCOPY AND MICROANALYSIS 2011 Part 1: Biological Sciences Symposia Microscopy Society of America 69th Annual Meeting Microanalysis Society 45th Annual Meeting International Metallographic Society 44th Annual Meeting Nashville, Tennessee, USA August 7–11, 2011 Edited by John Shields Stuart McKernan David Giovannucci Masashi Watanabe Donald Susan PROCEEDINGS MICROSCOPY AND MICROANALYSIS 2011 Part 2: Instrumentation and Techniques Symposia—I Microscopy Society of America 69th Annual Meeting Microanalysis Society 45th Annual Meeting International Metallographic Society 44th Annual Meeting Nashville, Tennessee, USA August 7–11, 2011 Edited by John Shields Stuart McKernan David Giovannucci Masashi Watanabe Donald Susan PROCEEDINGS MICROSCOPY AND MICROANALYSIS 2011 Part 3: Instrumentation and Techniques Symposia—II Microscopy Society of America 69th Annual Meeting Microanalysis Society 45th Annual Meeting International Metallographic Society 44th Annual Meeting Nashville, Tennessee, USA August 7–11, 2011 Edited by John Shields Stuart McKernan David Giovannucci Masashi Watanabe Donald Susan PROCEEDINGS MICROSCOPY AND MICROANALYSIS 2011 Part 4: Physical Sciences Symposia—I Microscopy Society of America 69th Annual Meeting Microanalysis Society 45th Annual Meeting International Metallographic Society 44th Annual Meeting Nashville, Tennessee, USA August 7–11, 2011 Edited by John Shields Stuart McKernan David Giovannucci Masashi Watanabe Donald Susan PROCEEDINGS MICROSCOPY AND MICROANALYSIS 2011 Part 5: Physical Sciences Symposia—II Microscopy Society of America 69th Annual Meeting Microanalysis Society 45th Annual Meeting International Metallographic Society 44th Annual Meeting Nashville, Tennessee, USA August 7–11, 2011 Edited by John Shields Stuart McKernan David Giovannucci Masashi Watanabe Donald Susan published by the press syndicate of the university of cambridge The Pitt Building, Trumpington Street, Cambridge, United Kingdom cambridge university press The Edinburgh Building, Cambridge CB2 2RU, UK 32 Avenue of the Americas, New York, NY 10013-2473, USA 477 Williamstown Road, Port Melbourne, VIC 3207, Australia Ruiz de Alarcón 13, 28014 Madrid, Spain Dock House, The Waterfront, Cape Town 8001, South Africa Copyright 2011 Microscopy Society of America First published 2011 Printed in the United States of America This publication constitutes Supplement 2 to Volume 17, 2011 of Microscopy and Microanalysis.. MicroscopyAND Microanalysis An Internat.ıonal Journal for the B.ıolog .ıcal and Phys.ıcal Sc.ıences T H E O F F I C I A L J O U R N A L O F MICROSCOPY SOCIETY OF AMERICA MICROANALYSIS SOCIETY MICROSCOPICAL SOCIETY OF CANADA / SOCIÉTÉ DE MICROSCOPIE DU CANADA MEXICAN MICROSCOPY SOCIETY BRAZILIAN SOCIETY FOR MICROSCOPY AND MICROANALYSIS VENEZUELAN SOCIETY OF ELECTRON MICROSCOPY EUROPEAN MICROBEAM ANALYSIS SOCIETY AUSTRALIAN MICROSCOPY AND MICROANALYSIS SOCIETY PORTUGUESE SOCIETY FOR MICROSCOPY P U B L I S H E D I N A F F I L I A T I O N W I T H ROYAL MICROSCOPICAL SOCIETY GERMAN SOCIETY FOR ELECTRON MICROSCOPY BELGIAN SOCIETY FOR MICROSCOPY MICROSCOPY SOCIETY OF SOUTHERN AFRICA Editor in Chief Editor, Biological Applications Robert L. Price Cell and Developmental Biology and Anatomy University of South Carolina Columbia, SC 29209 e-mail: Bob.Price@uscmed.sc.edu Editor, Materials Applications David J. Smith Department of Physics School of Materials Arizona State University Tempe, Arizona 85287-1504 e-mail: david.smith@asu.edu Editor, Scanning Probe Microscopies Phillip Russell Physics and Astronomy Appalachian State University Boone, North Carolina 28608 e-mail: russllp@appstate.edu Editor, Atom Probe Thomas Kelly Cameca Instruments, Inc. A Business Unit of AMETEK, Inc. Madison, WI 53711-4951 e-mail: Thomas.Kelly@ametek.com Editor, Light and Fluorescence Microscopies Brian Herman Cellular and Structural Biology University of Texas at San Antonio San Antonio, Texas 78284-7762 e-mail: hermanb@uthscsa.edu Editor, Biological Applications Heide Schatten Veterinary Pathobiology University of Missouri-Columbia Columbia, Missouri 65211-5030 e-mail: schattenh@missouri.edu Editor, Microanalysis John Mansfield Electron Microbeam Analysis Lab North Campus, 417 SRB University of Michigan Ann Arbor, MI 48109-2143 e-mail: jfmjfm@umich.edu Editor, Correlative and Emerging Microscopy Applications Vinayak P. Dravid Materials Science and Engineering Northwestern University Evanston, Illinois 60208-3105 e-mail: v-dravid@northwestern.edu Special Issues and Reviews Editor Jay Jerome Vanderbilt University Medical Center Nashville, TN 37232 e-mail: jay.jerome@vanderbilt.edu Book Review Editor Cynthia S. Goldsmith Centers for Disease Control Atlanta, GA 30333 e-mail: csg1@cdc.gov Calendar Editor Nan Yao Princeton University Princeton, NJ 08540 e-mail: nyao@Princeton.edu Expo Editor Richard E. Edelmann Miami University Oxford, OH 45056 e-mail: edelmare@muohio.edu Proceedings Editor John Shields University of Georgia Athens, GA 30602 e-mail: jpshield@uga.edu Copyright Information All articles published in this journal are protected by copyright, which covers the exclusive rights to reproduce and distribute the article ~e.g., as offprints!, as well as all translation rights.. No material published in this journal may be reproduced photographically or stored on microfilm, in electronic data bases, video disks, etc., without first obtaining written permission from the publisher. |